Energy Dispersive X-ray Spectrometer

Quantity :
0
Sample Price :
On Demand
Payment Terms :
Letter of Credit
Price Valid Till :
Dec,31, 2020

AnalysisStation JED-2300T is an integration system of TEM/EDS based on a concept of “Image and Analysis”. Data management is carried out by automatically collecting the parameters such as magnification and accelerating voltage along with analysis data. Three types of Silicon Drift Detector (SDD) EDS are available, with the detection area being 30mm2, 60mm2 and 100mm2 respectively. The larger the detection area is, the greater the detection sensitivity becomes. By incorporating Dry SD100GV Detector (detection area 100mm2) to JEM-ARM200F (HRP), a large light receiving area and the high resolution are simultaneously realized, and a clear distinction of light elements such as “B,C,N,O” is possible.

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Manufacturing, marketing, development & research of Sophisticated Scientific Instruments (Electron Optical Instrument, Analytical Instrument), Measuring Instruments, Semiconductor Equipment, Industrial Equipment, and Medical Equipment, processing, maintenance & services of related products and parts, as well as procurement & sales of peripherals